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VS-OSP Non-contact Optical Surface Profiler

VS-OSP charts topography and combine with other techniques for constant distance mode imaging.

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  • Highlights +

    • OSP uses laser-based technology to accurately map topography of any sample
    • When combined with other techniques, OSP data provides a mechanism for Constant-Distance measurements removing a key complication of data interpretation
  • VersaSCAN Scanning Electrochemical Workstation +

    VersaSCAN Scanning Electrochemical Workstation
    The VersaSCAN Scanning Electrochemical Workstation is a single platform capable of providing spatial resolution to both electrochemical and materials-based measurements.  This system integrates a positioning system, measurement instrumentation and probe to provide local information.  Traditional electrochemical experiments measure an average response over the entire electrode, electrolyte interface.  Rarely is a sample homogenous.  Samples often consist of local sites of passivate or active nature and sites of anodic or cathodic character.  This need to investigate localized phenomenon led to the emergence of scanning probe electrochemistry.

    Positioning System:

    • VersaSCAN is unique in the use of piezoelectric motors to drive the stages on all axes.
    • Piezos are materials that move with very high precision, accuracy, repeatability but over small distances.  We use them to drive stages; therefore we reach a combination of scan area and scan resolution that is unmatched.
    • AFMs do not move with the same scan range (usually piezo-element only; without the stage)
    • Alternative positioning system designs use step motors, exclusive or as a basis for a hybrid system, and cannot move with the same resolution.

    System Installation and Training:

    This is full ‘white-glove’ service. An experienced team member arrives on site – unpacked the instrumentation, assembles, levels the system.  A developed checkout procedure is executed on a test sample to verify the system (installation).  The fundamentals of the technique are covered.  The users are trained to execute the same test (training).

    Multi-Technique platform

    The VersaSCAN platform offers the ability to leverage the positioning system and software as common components for other scanning probe techniques.  The best-in-class measurement characteristics of AMETEK equipment combines with this unique positioning system for high-resolution measurements even at large areas.

  • Applications and Software +

    Applications and Software

    The VersaSCAN OSP integrates the Base with a high-accuracy, high-speed laser displacement sensor. The OSP technique uses diffuse reflection mechanism to measure topography of a sample. OSP can be used to measure topography, as a very sensitive leveling mechanism, or charting topography to be implemented with other scanning probe techniques for constant-distance mode operation.

    • Optical Surface profiling technique to measure topography of sample
    • Can be combined with other VersaScan techniques for constant distance mode mapping


  • Brochure and Manual +

  • Differentiated Specifications +

    VersaSCAN Positioning System

     Specifications  VersaSCAN Base (VS-BASE)
    Positioning System Range X-axis:  100 mm
    Y-axis:  100 mm 
    Z-axis:  100 mm 
    Positioning Motor Technology X-axis:  Piezoelectric motors,
               no stepper-motor
    Y-axis:  Piezoelectric motors,
               no stepper-motor
    Z-axis:  Piezoelectric motors,
               no stepper-motor 

    OSP Measurement Technology

    Measurement Range ± 10 mm
    Laser  Class 2, 650 nm, 0.95 mW
    Repeatability  0.025 µm
    Spot Size  50 µm at reference distance of 50 mm
  • Options +

    Description Model Number
    Complete Video Camera Assembly
    Small cell for VersaSCAN systems (~ 7 mL) VS-MLCELL 

    Large cell for VersaSCAN systems (~ 1 L)  VS-LCELL
  • Video +

    Watch video demonstrations of the VS-OSP Non-contact Optical Surface Profiler

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