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ModuLab XM MTS - Materials Test System

315 ModuLab XM ECS
The latest generation ModuLab® XM MTS system is designed with modularity and flexibility in mind to allow for a wide range of applications. Purpose built for materials test research the ModuLab XM provides:

  • I-V (voltage scans with current measurement - used to characterize electronic and dielectric materials)
  • P-E (polarization / electric field - used to run hysteresis tests to characterize ferroelectric materials) 
  • High-speed pulse (used to activate charge carriers in electronic and dielectric materials)
  • Staircase and smooth stepless analog ramp waveforms
  • Impedance, admittance, permittivity / capacitance, electrical modulus
  • C-V capacitance - voltage, Mott-Schottky
  • Automatic sequencing of time domain and impedance/capacitance measurements 

ModuLab XM MTS is able to auto-sequence all of the above techniques for charge carrier activation and analysis, without changing sample connections. Temperature control is also built into the software via cryostats, furnaces and probe stations.

The ModuLab XM is a modular system that can be configured for the following applications:
Dielectric Materials- Ferro/piezoelectrics | MEMs | NEMs| multiferroics | polymers |solid oxides SOFC | ionic conductors | solid electrolytes, quantum dots
Electronic Materials - LED | LCD | OLED | MEMs | OPV | Si | DSSC | OFET | Ge | GaAs | Perovskite materials

     Click here to download the latest version of our XM-studio software.

  • Documents +

  • Specifications +

    General Control Module Slave Modules
    100 V High Voltage Femto Ammeter 2 A Booster
    Chassis slots taken Single Single Single Double
    Measurement mode 2 or 4 terminal 2 or 4 terminal 2 or 4 terminal 2 or 4 terminal
    Sample connections from module Gen, VHi, VLo, I Gen, VHi, VLo
    MAT- I
    MAT- Gen, VHi, VLo
    Gen, I
    MAT- VHi, VLo
    Sample connection cables (1 m length) 4 x BNC to BNC MAT cables Triax to BNC MAT cables
    Floating Yes Yes Yes Yes
    General Output - (Gen) XM MAT 1 MHz XM MHV100 XM MFA XM MBST 2A
    Maximum waveform generator sample rate 64 MS/s
    Uses MAT N/A Uses MAT
    Maximum voltage (open circuit load) DC + peak AC
    (subject to slew rate limit)
    ±8 V ±100 V N/A ±8 V with MAT
    ±20 V with MHV
    Maximum voltage resolution 150 μV (< 3 V) 
    400 μV (≥ 3 V)
    2 mV (< 37 V) 
    5 mV (≥ 37 V)
    N/A 1.5 mV
    Maximum output current ±100 mA ±100 mA N/A ±2 A
    Output impedance (nominal) 50 Ω 50 Ω N/A < 1 Ω
    Applied voltage error (open-circuit load) ±0.2% setting 
    ±800 μV (< 3 V) 
    / ±2 mV (≥ 3 V)
    ±0.2% setting
    ±12.5 mV (< 37 V) 
    / ±35 mV (≥ 37 V)
    N/A ±0.2% setting + 
    ±10 mV (< 3 V) 
    / ±25 mV (≥ 3 V)
    Voltage sweep rate 1.6 MV/s to 1 μV/s 10 MV/s to 1 μV/s N/A 1.6 MV/s to 1 μV/s
    Recommended maximum sweep rate
    (using 1 MS/s acquisition rate)
    25 kV/s 150 kV/s N/A 25 kV/s
    Minimum pulse duration 1 μs Uses MAT N/A Uses MAT
    Maximum slew rate >10 V/μs >15 V/μs N/A >10 V/μs
    Voltage Measurement - (VHi/VLo) XM MAT 1MHz XM MHV100 XM MFA XM MBST 2A
    Maximum voltage ±8 V ±100 V N/A N / A
    Voltage ranges 8, 3, (V) 
    300, 30, 3 (mV)
    100, 37.5, 3.75 (V) 
    375 , 37.5 (mV)
    N/A N / A
    Voltage measurement error ±0.1% reading + 
    ±0.05% range + 
    ±100 μV
    ±0.1% reading + 
    ±0.05% range + 
    ±100 μV
    N/A N / A
    Maximum time domain measurement rate 1 MS/s N / A N/A N / A
    Maximum time record Unlimited N / A N/A N / A
    Current measurement - (I) XM MAT 1MHz XM MHV100 XM MFA XM MBST 2A
    Maximum current ±100 mA N / A ±100 mA ±2 A
    Current ranges 100 mA, 30 mA to 
    30 nA in decades
    N / A 100 mA, 30 mA to 
    3 pA in decades
    2 A plus MAT 
    Maximum resolution 1.5 pA N / A 0.15 fA 1.5 pA (MAT)
    Current measurement error ±0.1% reading + 
    ±0.05% range + 
    ±100 pA
    N / A ±0.1%** reading + 
    ±0.05% range + 
    ±30 fA
    ±0.1% reading + 
    ±0.05% range + 
    ±0.1 mA
    Auxiliary voltage inputs XM MAT 1MHz XM MHV100 XM MFA XM MBST 2A
    Number of auxiliary DC channels Four N / A N/A N / A
    Voltage ranges 8 V, 3 V to 3 mV N / A N/A N / A
    Maximum resolution 1 μV N / A N/A N / A
    Synchronized to VHi, VLo measurement Yes N / A N/A N / A
    **MFA Femto Ammeter current measurment "reading %" error term is 0.2% for 300 pA range, 2% for 30 pA range and 5% for 3 pA range

    Specifications XM MREF
    Sample / Reference Option XM MREF
    Chassis slots taken Single
    Reference modes Internal / External
    Connections to MAT, MHV, or MFA Gen, I
    Connection to sample 1 m BNC cables
    Connection to internal / external reference 1 m BNC cables
    Calibrated reference capacitors 10nF to 1pF 
    (3 per decade)

    Specifications XM MFRA
    Frequency Response Analyzer Option XM MFRA 1MHz
    Chassis Slots taken
    Maximum sample rate
    40 MS/s
    Frequency Range 10 μHz to 1 MHz
    Frequency resolution 1 in 65,000,000
    Frequency error ±100 ppm
    Minimum measurement integration time 10 ms
    Analysis modes (10 μHz to 1 MHz)
    Fixed frequency
    Single sine
    Multi-sine / harmonic frequencies

    Linear / logarithmic
    All or selected
    Accuracy (ratio) ±0.1%, ±0.1º
    Anti-alias, digital filters, DC bias reject Automatic

    Chassis specification
    Chassis type 8 slot or 4 slot
    Modules per chassis 8 maximum
    Line voltage 90 V to 264 V AC 
    47 - 63 Hz
    Power 600 VA maximum
    Communications Ethernet 100BASE-T
    Digital output 3 per MAT channel
    Dimensions w x h x d 
    8 slot / 4 slot
    450 / 310 x 275 x 460 mm 
    17.7 / 12.2 x 10.8 x 18.1 in
    Weight 8 slot / 4 slot 37 / 21 kg - 82 / 46 lb
    Safety complies with: BS EN 61010
    EMC complies with: BS EN 61325
    Temperature range 
    Specified Accuracy 

    5° to 40°C (41° to 104°F) 
    10° to 30°C (50° to 86°F) 
    -25° to 70°C (-13° to 158°F)

    Typical PC configuration
    PC requirement Pentium IV 1 GHz, 1 Gb RAM
    Disk space >10 Gbyte
    Communications Ethernet 100BASE-T
    Display 17 “ or larger SVGA
    Operating system Windows XP Professional 
    or Vista Business 
    or Windows 10, 8, 7 Professional
  • Options +

    ModuLab XM MTS Front Panel
    XM MFRA 1MHz XM MFRA 1MHz is the most versatile Frequency Response Analyzer available today.  It is fully compatible with all XM slave modules for high voltage, high/low current and sample/reference AC measurements, and is able to auto-sequence time domain and AC measurements without switching cables.
    XM MAT 1MHz MAT 1MHz makes use of latest generation high-technology hardware for accurate waveform generation and data acquisition.
    XM MHV100 High Voltage +/- 100V Option
    (available for time domain and impedance tests, and can be used in combination with other options)
     XM MFA Femto Ammeter (Low Current) Option 
    (available for time domain and impedance tests, and can be used in combination with other options)
    XM MREF Sample/Reference Switching Option 
    (available for time domain and impedance tests, and can be used in combination with other options)
    XM MBST 2A
    2A Booster Option
    (available for time domain and impedance tests, and can be used in combination with other options)
    XM Chas 04 4 slot chassis
    XM Chas 08 8 slot chassis
    Notes: Each of the modules & options takes one slot in the chassis, except for MBST-2A which take two slots
    At least one MAT 1MHz is required per chassis, all options are associated with the MAT
  • Accessories +

    • Furnace - Materials Analysis Accessories
      129620A High Temperature Test System

      • Room temperature to 1200ºC
      • For testing solid oxide, solid electrolyte, super ionic conductors
      • Dual gas design for SOFC
      • Split tube furnace for easy sample load

      Keep Reading

    • Cryostat System - 129610A LHe/LN2
      129610A LHe/LN2 Cryostat System

      • Cryogen not in contact with sample - prevents sample damage
      • Low cryogen usage (low running cost) - capillary tube around sample space
      • 5 K to 600 K (compatible with liquid helium and liquid nitrogen)
      • Custom sample holder for compatible with solid, powder or liquid samples

      Keep Reading

    • 12962A Room Temperature Sample Holders
      12962A Room Temperature Sample Holders

      • Attachments for solid, powder and liquids
      • Large range of sample sizes can be accommodated using interchangeable electrodes
      • Guard ring to exclude errors due to fringing at edge of samples
      • Integrated micrometer for permittivity calculations

      Keep Reading

  • Video +

    Watch video demonstrations of the ModuLab XM MTS - Materials Test System

  • Software +

    • ZView Software
      ZView Software

      • ZView is the companion EIS data analysis software for ZPlot
      • Multiple display formats (impedance, admittance, capacitance, permittivity and electrical modulus)
      • Comprehensive data analysis capabilities include an extensive library of equivalent circuit data fit models – R, C, L, Warburg, Distributed Elements

      Keep Reading