| Techniques: |
I-V, C-V, P-E, impedance, capacitance, permittivity, dielectric constant/loss, grain size, polarization thresholds, AC conductivity |
| Applications: |
PC Memory, FeRAM, actuators, accelerometers, microphones, ink-jet heads, sensors |
| Types: |
Ferroelectric, piezoelectric, MEMs, NEMs, multiferroics, thin film, PZT, Barium Titanate, Perovskite |
Ferroelectrics have piezoelectric properties but in addition exhibit spontaneous reversible polarization on application of an electric field, and are therefore widely used in semiconductor thin film memory devices (FRAM). Ferroelectrics also exhibit non-linear permittivity (capacitance) response as a function of applied electrical field making them very useful in electronic applications including tunable capacitors. Other applications include sensors, ultrasound, sonar, micro-actuators, infrared sensors…
Solartron Analytical provides the following test systems for the characterization of these materials:
The ModuLab XM MTS Test System provides complete time domain and AC device characterization using a wide range of “Plug and Play” options
- The Model 1260A Impedance Gain Phase Analyzer is widely referenced in publications and is able to test capacitance / C-V / impedance / Mott-Schottky from 10 µHz to 32 MHz (over 12 decades of frequency), enabling full characterization of dielectric materials.
- The Model 1296A Dielectric Interface System extends the impedance range of the 1260A to over 100 TOhm for testing ceramic insulators and dielectrics in addition to providing greater magnitude and phase accuracy by use of sample/reference techniques, reducing errors due to cables.
- Temperature control options including Cryostats and Furnaces are available with all of the above measurement systems that provide automatic PC control of the sample temperature and allow complete material characterization