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Scanning Electrochemical Systems

The VersaSCAN is a single platform capable of providing spatial resolution to both electrochemical and materials-based measurements. Each VersaSCAN is based on a common high-resolution, long-travel, closed-loop positioning system mounted to a vibration-resistant optical base. Different auxiliary pieces are mounted to the positioning system. These ancillary pieces (e.g., an electrometer, piezo vibration unit, or a laser sensor) provide functionality to the positioning system for different scanning probe experiments. VersaSTAT potentiostats and Signal Recovery Lock-in Amplifiers are integrated via ethernet control to make accurate measurements of these small signals.

Each technique uses a different measurement probe that is positioned close, but not in contact to the sample.  After a measurement is made at the probe, its position is incremented.  Plotting recorded parameter versus probe position creates a data map.  Depending on the technique, this map could represent local electrochemical current, impedance, relative work function, or topography.

  • VersaSCAN Electrochemical Scanning Microscopy - SECM
    VS-SECM (DC and AC) Scanning Electrochemical Microscope

    SECM is the most popular scanning probe technique of the VerasSCAN platform based on its resolution and flexibility across applications as it controls and monitors electrochemical reactions

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  • VersaSCAN Electrochemical Scanning Microscopy - SECM
    VS-SECM (DC and AC) Scanning Electrochemical Microscope

    SECM is the most popular scanning probe technique of the VerasSCAN platform based on its resolution and flexibility across applications as it controls and monitors electrochemical reactions

    Keep Reading
  • VersaSCAN Electrochemical Scanning Microscopy - SECM
    VS-STYLUS Constant Distance SECM

    Complement to traditional SECM measurements, STYLUS probe makes soft contact with sample.  This represents the lowest cost constant distance SECM method available and is applicable to biological samples.

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  • VersaSCAN Electrochemical Scanning Microscopy - SECM
    VS-STYLUS Constant Distance SECM

    Complement to traditional SECM measurements, STYLUS probe makes soft contact with sample.  This represents the lowest cost constant distance SECM method available and is applicable to biological samples.

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  • VS-LEIS Localized Electrochemical Impedance Spectroscopy

    Localized EIS (LEIS) measurements give spatially resolved impedance analysis of substrates.  LEIS has measured local State-of-Charge of Li-ion batteries and degradation of corrosion-resistant coatings.

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  • VS-LEIS Localized Electrochemical Impedance Spectroscopy

    Localized EIS (LEIS) measurements give spatially resolved impedance analysis of substratesLEIS has measured local State-of-Charge of Li-ion batteries and degradation of corrosion-resistant coatings.

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  • VS-LEIS Localized Electrochemical Impedance Spectroscopy

    Localized EIS (LEIS) measurements give spatially resolved impedance analysis of substratesLEIS has measured local State-of-Charge of Li-ion batteries and degradation of corrosion-resistant coatings.

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  • VersaScan Scanning Vibrating Electrode Technique - SVET
    VS-SVET Scanning Vibrating Electrode Technique

    SVET maps localized voltage gradient between tip and substrate for determination of localized current density.  SVET was developed for analysis of non-uniform corrosion events, such as pits, welds and galvanic couples.

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  • VersaScan Scanning Vibrating Electrode Technique - SVET
    VS-SVET Scanning Vibrating Electrode Technique

    SVET maps localized voltage gradient between tip and substrate for determination of localized current density.  SVET was developed for analysis of non-uniform corrosion events, such as pits, welds and galvanic couples.

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  • VS-SKP Scanning Kelvin Probe Microscope

    SKP measures relative work function between probe and sample.  This experiment is done in air and can correlate this Work Function to Corrosion potential (Ecorr)

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  • VS-OSP Non-contact Optical Surface Profiler

    OSP technique measures the topography of sample.  Data can be combined with other VersaScan techniques for constant distance mode mapping as the probe adjusts in Z and it scans in X,Y.

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  • VS-SKP Scanning Kelvin Probe Microscope

    SKP measures relative work function between probe and sample.  This experiment is done in air and can correlate this Work Function to Corrosion potential (Ecorr)

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  • VS-SDC Scanning Droplet Cell

    SDC confines the electrochemical measurement to a small droplet of electrolyte.  The flowing droplet can be moved across the sample surface to map an area.

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  • VS-SDC Scanning Droplet Cell

    SDC confines the electrochemical measurement to a small droplet of electrolyte.  The flowing droplet can be moved across the sample surface to map an area.

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  • VS-OSP Non-contact Optical Surface Profiler

    OSP technique measures the topography of sample.  Data can be combined with other VersaScan techniques for constant distance mode mapping as the probe adjusts in Z and it scans in X,Y.

    Keep Reading