| Techniques: |
I-V, C-V, P-E, impedance, capacitance, permittivity, dielectric constant/loss, grain size, polarization thresholds, AC conductivity |
| Applications: |
PC Memory, FeRAM, actuators, accelerometers, microphones, ink-jet heads, sensors |
| Types: |
Ferroelectric, piezoelectric, MEMs, NEMs, multiferroics, thin film, PZT, Barium Titanate, Perovskite |
MEMs and NEMs (Micro/Nano Electro Mechanical systems) allow many functions including those from piezo/ferroelectric materials to be combined into a single device. Examples include 3D gyroscopes and accelerometers that are used in the latest games machines and hand held controllers as well as in military and aerospace inertial guidance applications.
Solartron Analytical provides the following test systems for the characterization of these materials:
- The ModuLab XM MTS Test System provides complete time domain and AC device characterization using a wide range of “Plug and Play” options
- The Model 1260A Impedance Gain Phase Analyzer is widely referenced in publications and is able to test capacitance / C-V / impedance / Mott-Schottky from 10 µHz to 32 MHz (over 12 decades of frequency), enabling full characterization of dielectric materials.
- The Model 1296A Dielectric Interface System extends the impedance range of the 1260A to over 100 TOhm for testing ceramic insulators and dielectrics in addition to providing greater magnitude and phase accuracy by use of sample/reference techniques, reducing errors due to cables.
- Temperature control options including Cryostats and Furnaces are available with all of the above measurement systems that provide automatic PC control of the sample temperature and allow complete material characterization