| Techniques: |
I-V, fast pulse, J-L-V, C-V, capacitance, impedance, Mott-Schottky
|
| Applications: |
Device degradation, mobility, charge carrier concentration, depletion layer, trap state, device lifetime and material purity / defects |
| Types: |
OLED, LED, LCD, AMOLED, PLED, Perovskite, quantum dot, flexible displays |
New display technologies are enabling great advances in the development of portable computers, cell phones, flexible / transparent displays (e.g. automotive head-up displays), touch panels, and lightweight thin-screen TVs. For mobile devices there is a continuous push for improved battery life (low power), reduced weight and brighter screens, and new display technologies including OLED and AMOLED are providing much improved performance over previous generation displays. New technologies, including OLED, are also being developed to replace the incandescent light bulb by more efficient and longer lasting light sources, allowing more varied control of room lighting and colors, with the new technologies extending to automotive and street lighting applications.
Solartron Analytical provides the following test systems for the characterization of display materials:
The
ModuLab XM MTS Test System provides complete time domain and AC device characterization using a wide range of “Plug and Play” options
The Model 1260A Impedance Gain Phase Analyzer is widely referenced in publications and is able to test capacitance / C-V / impedance / Mott-Schottky from 10 µHz to 32 MHz (over 12 decades of frequency), enabling full characterization of dielectric materials.
The Model 1296A Dielectric Interface System extends the impedance range of the 1260A to over 100 TOhm for testing ceramic insulators and dielectrics in addition to providing greater magnitude and phase accuracy by use of sample/reference techniques, reducing errors due to cables.
Temperature control options including Cryostats and Furnaces are available with all of the above measurement systems that provide automatic PC control of the sample temperature and allow complete material characterization
Glass and polymer dielectric materials used as display substrates and touch panels can also be tested using the above equipment
Refer to our application note for more information –
Characterization of OLEDs