Materials Lab XM

• Impedance range from 1 mOhm to 1 TOhm (1E15 Range)
• Small footprint and application-focus design
• Auxiliary measurement port for synchronized measurement of optical, mechanical or other transducers.
• Instant switching between time Domain (IV, fast pulse) and AC (C-V, impedance, Mott-Schottky) measurements without changing sample connections
• Low frequency to 10 µHz for degradation, trap state and material purity studies
• XM-Studio software is included with all XM Series systems
• Materials Lab XM impedance accuracy contour plot highlights Solartron's best in class measurement performance.

Our line of Materials Test Systems test combined electrical, thermal, and mechanical properties of dielectrics, insulators and electronic materials.  These systems include specialized accessories:  High Voltage Amplifiers, Cryostats, Furnaces, and Sample Holders for liquids, powders, and solid materials.

The ModuLab XM MTS can perform time domain (DC) and frequency domain (AC) tests.  Accessories control temperature from cryostat to furnace level and integrate through software control with the core measurement electroncis to create a sustem to study a wide ranges of mateirals.  As with other ModuLab plarogn systems it can be expanded for electrochemical or photoelectrochemical experiments.

The Materials Lab XM users the same XM based platform to deliver ModuLab performance to a focused application, the study of Materials.  This focused design allows this instrument to occupy a small footprint. ModuLab software includes integrated equivalent circuit analysis, MultiSine and Harmonic Analysis for non-linear materials.  

The 1260A Gain-Phase Analyzer (or Frequency Response Analyzer) is the cornerstone of FRA technology.  The 1260A can be used as a stand-alone unit, but its applications to Materials is greatly expanded when combined with the 1296A Dielectric Interface.  This solution measures at both high-frequency and high-impedance.

The Materials Lab XM can perform time domain (DC) and frequency domain (AC) tests.  Accessories control temperature from cryostat to furnace levels and integrate through software control with the core measurement electronics to create a system to study a wide range of materials.  ModuLab XM platform systems can be expanded for electrochemical or photoelectrochemical experiments.

Materials Lab XM’s impedance accuracy contour plot highlights Solartron’s best in class measurement performance.

The Materials Lab XM is a modular system that can be configured for the following applications:
Dielectric Materials	Ferro/piezoelectrics | MEMs | NEMs| multiferroics | Polymers | Solid oxides SOFC | ionic conductors | Solid electrolytes, quantum dots
Electronic Materials	LED | LCD | OLED | MEMs | OPV | Si | DSSC | OFET | Ge | GaAs | Perovskite materials

Specifications	ModuLab XM MTS	Materials Lab XM	1260A / 1296A
Maximum Frequency	1 MHz	1 MHz	32 MHz
Combines with DC for Electrochemical Measurements	Yes, with XM PSTAT 1 MS/s	No	Yes, with 1287A Electrochemical Interface
Highest Impedance	100 TOhms	1 TOhms	100 TOhms
Low Impedance	10 µOhms	1 mOhms	100 mOhms
Software	XM Studio	XM Studio	SMaRT, ZPLOT

Power Booster PART NUMBER	Voltage, Current, Power
BOOST6V100A Power Booster	6V, 100A
BOOST8V50A Power Booster	8V, 50A
BOOST10V60A Power Booster	10V, 60A
BOOST12V20A Power Booster	12V, 20A
BOOST24V10A Power Booster	24V, 10A
BOOST50V5A Power Booster	50V, 5A
BOOST50V25A Power Booster	50V, 25A , 125 W
BOOST100V3A Power Booster	100V, 3A