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SECM

Control and monitor redox reactions with high spatial resolution

• Advanced Techniques:
STYLUS option as a Soft Probe, AC-SECM
•Heterogenous Kinetics, Porous Membrane

LEIS

Measure impedance, phase angle, and currents by measuring AC response.

• Coating failures
• Mapping State-of-Charge of Li-ion batteries

SKP

Measure Work Function Difference in air by a non-destructive capacitance-method.



• High-Resolution probes to 10-microns (Patent Pending)

• Anodic/Cathodic mapping of sample, even under coating

SVET
Image local currents by measuring voltage fields in solution

• Localized corrosion events, such as pitting
• Galvanic corrosion