The VersaSCAN Optical Surface Profiling (VSC-OSP) technique is a laser-based method used to analyze surface topography, measuring height variations along the Z-axis. This application note details how to determine and verify the Scaling Factor, a critical adjustment for constant distance SECM measurements, particularly in liquid environments where refractive index differences impact accuracy. Proper calibration ensures reliable surface morphology data, enhancing electrochemical imaging and analysis.
Explore this detailed application note to see how the VersaSCAN SECM and OSP technique optimize scaling factor adjustments for precise electrochemical surface mapping.
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