Scanning electrochemical microscope
Ideal for Corrosion, Energy Storage & Materials Science
Scanning electrochemical microscope
The VersaSCAN is a single platform capable of providing spatial resolution to both electrochemical and materials-based measurements.
Each VersaSCAN is based on a common high-resolution, long-travel, closed-loop positioning system mounted to a vibration-resistant optical base. Different auxiliary pieces are mounted to the positioning system. These ancillary pieces (e.g., an electrometer, piezo vibration unit, or a laser sensor) provide functionality to the positioning system for different scanning probe experiments.
Some key Advanced Surface Analysis Techniques for Electrochemical Research
Each technique uses a different measurement probe that is positioned close, but not in contact to the sample. After a measurement is made at the probe, its position is incremented. Plotting recorded parameter versus probe position creates a data map. Depending on the technique, this map could represent local electrochemical current, impedance, relative work function, or topography.
Each technique uses a different measurement probe that is positioned close, but not in contact to the sample. After a measurement is made at the probe, its position is incremented. Plotting recorded parameter versus probe position creates a data map. Depending on the technique, this map could represent local electrochemical current, impedance, relative work function, or topography.
Used to map localized electrochemical activity on surfaces, SECM is essential for studying corrosion, catalytic reactions, and material interfaces. Both DC and AC modes provide high-resolution imaging for reaction kinetics and surface characterization.
Maintains a fixed probe-sample distance for precise electrochemical imaging on uneven surfaces. Ideal for high-resolution mapping of coatings and microstructures.
Maps current density in solution to identify corrosion hotspots and galvanic interactions. Commonly used in corrosion science and material degradation studies.
Scanning Electrochemical Systems
SECM is the most popular scanning probe technique of the VerasSCAN platform based on its resolution and flexibility across applications
Complement to traditional SECM measurements, STYLUS probe makes soft contact with sample. This represents the lowest cost constant distance SECM method available
Localized EIS (LEIS) measurements give spatially resolved impedance analysis of substrates. LEIS has measured local State-of-Charge of Li-ion batteries
SVET maps localized voltage gradient between tip and substrate for determination of localized current density. SVET was developed for analysis of non-uniform corrosion events, and material degradation studies
SKP measures relative work function between probe and sample. This experiment is done in air and can correlate this Work Function to Corrosion potential (Ecorr).
SDC confines the electrochemical measurement to a small droplet of electrolyte. The flowing droplet can be moved across the sample surface to map an area.
OSP technique measures the topography of sample. Data can be combined with other VersaScan techniques for constant distance mode mapping as the probe adjusts.
Application Notes
