Scanning Electrochemical Workstation
VersaSCAN Localized Electrochemical Scanning System
Electrode surfaces are rarely uniform—corrosion, coatings, and sensor materials all show localized anodic, cathodic, or conductivity variations. Traditional bulk electrochemical measurements average the entire surface, masking critical hotspots. The Princeton Applied Research VersaSCAN solves this by delivering true localized electrochemical insight.
How VersaSCAN Works
VersaSCAN uses a 100 nm‑resolution 3D closed-loop positioning system to bring specialized probes within microns of the surface—without contact. As the probe rasters across the sample, it generates 3D spatial maps of electrochemical or physical activity, revealing behaviors impossible to detect with standard techniques.
Scanning Techniques on One Platform
SECM – Scanning Electrochemical Microscopy
High‑resolution mapping of reaction rates, catalytic activity, and biological/electrochemical processes using dual potentiostats. Supports feedback, generator–collector, constant‑height, and constant‑current modes.
SVET / SVP – Scanning Vibrating Electrode Technique
Maps local corrosion currents by detecting voltage gradients in solution. A vibrating probe with lock‑in amplification enables highly sensitive detection of active corrosion sites.
LEIS – Localized Electrochemical Impedance Spectroscopy
Impedance mapping using AC excitation and dual‑element probes. Generates local Bode/Nyquist plots or area maps at a fixed frequency—ideal for coatings, corrosion, and interface studies.
SKP – Scanning Kelvin Probe
Non‑contact, non‑electrochemical mapping of work‑function differences. Works through coatings and is widely used in corrosion, semiconductor, and forensic studies.
SDC – Scanning Droplet Cell
Performs localized electrochemical tests using a flowing micro‑droplet, enabling confined‑area voltammetry, corrosion studies, and screening of heterogeneous surfaces.
OSP – Optical Surface Profiler
Laser‑based surface topography mapping. Enables height‑tracking for constant‑distance SECM and supports advanced surface morphology studies.