Impedance Analyzer / Materials Test Systems

In most cases impedance analyzers apply sinusoidal waveform to a sample at a set frequency and measures the AC voltage and current across the sample. The ratio of these values gives the impedance. For resistive samples the voltage and current waveforms are in-phase, but for capacitive or inductive components, a phase shift occurs. Hence the sample is fully characterized by sweeping the frequency of the sinewave over a wide range.

Standard Impedance Analyzers can measure only upto the range of megaohm (MΩ). For ultra-high impedance materials such as dielectrics, measurements may extend into the gigaohm (GΩ) or teraohm (TΩ) range. In such cases, low current interfaces or femto-ammeters are used to convert tiny currents (pA or fA) into measurable signals.

At high frequency or high impedance, cables and other systematic impedances can affect the accuracy of measurements. In this case, sample/reference techniques are often employed that measure known samples and use those measurements to compensate for the effect of cables.

Material properties often change across different temperatures. This is why samples must be tested at various high or low temperatures. In this case, systems are configured with furnaces or cryostats to enable detailed testing across a range of temperatures.

Advanced research may call for custom setups for sputtering, neutron reflectivity, thin-film tests, micro-electrodes, Van-der-Pauw, and many other test measurements. At SI, we offer tailored solutions for these applications—contact us to learn more.

For detailed material analysis, SI uses systems that combine electrical, thermal, and mechanical properties of insulators, dielectrics, and electronic materials. These systems include specialized accessories such as High Voltage Amplifiers, Cryostats, Furnaces, and Sample Holders for liquids, powders, and solid materials.