ModuLab XM Photoelectrochemical Test System

315 ModuLab XM PhotoEchem
The system, based upon Solartron Analytical's world-leading experience in transfer function measurements, offers a high-quality measurement platform for characterizing a range of photoelectrochemical devices such as DSSC's, Perovskite cells, and Photoanodes," noted Professor Laurie Peter, world leading expert, University of Bath, UK. Professor Peter acted as scientific advisor during the development of the ModuLab PhotoEchem system and helped ensure the system met the requirements of the most demanding photovoltaic researchers in the market today.

Key Features
  • Fully Integrated Optical and Electrical Measurement System
  • Auto-Run and Auto – analyze facility. Only 3 mouse clicks to enter, run, and analyze complex DSSC tests with more than 300 individual steps! Ideal for new researchers to this field
  • Powerful, highly collimated and focused optics with > 0.1 Sun equivalent output
  • Reference Detection technique for elimination of phase and magnitude errors for high frequency IMPS and IMVS studies
  • Comprehensive Suite of Techniques including IMPS/IMVS, EIS with light control, Charge Extraction and Photovoltage decay
  • I-V analysis including Fill Factor, Efficiency and Power 
  • NIST traceable calibration routines for repeatability and reproducibility
  • ND filter included with optical system for low light studies
  • IPCE add-on module with White Bias light source for studying all Photovoltaic and Photoanode devices.
Not just for DSSC's...

The system can equally be used for the following applications
  • Photoelectrochemical Studies
  • Quantum Dot and Organic Photovoltaics
  • Photosynthetic studies
  • Documents +

  • Specifications +


    Potentiostat
    Slots Taken 1
    Cell Connections 2,3,or 4 terminal
    Instrument Connections CE, WE, RE, lo
    Floating Measurements yes
    Impedance Measurement Bandwidth 1 MHz (via FRA)
    Maximum ADC sample rate 1MS/s
    Smooth Scan Generator 64 MS/s interpolated and filtered
    Maximum Time Record 1 MS/s
    DC Scan Rate (potentiostatic) 1.6 MV/s to 1 µV/s
    DC Scan Rate (galvanostatic) 60 kA/s to 200 µAs
    Minimum Pulse Duration 1µs
    iR Compensation yes
    Counter Electrodes
    Voltage Polarization Range ±8 V (±100 V)*
    Current Polarization Range ±300 mA (± 2 A)*
    Maximum Compliance (Ce. vs LO) ±8 V
    Bandwidth (decades steps) 1 MHz to 10 Hz
    Polarization V / I error (setting and range 0.1% + 0.1%
    Slew Rate >10 V / µs
    Reference Inputs (RE)
    Connections Differential Input
    Cable Shields Driven / Ground
    Maximum Voltage Measurements ±8 V
    Ranges 8 V to 3 mV
    Accuracy (reading% + range% + offset) 0.1% + 0.05% + 100 µV
    Maximum Resolution 1 µV
    Input Impedance >100 GΩ, < 28 pF
    Input Bias Current <10 pA
    Working Electrode (WE)
    Maximum Current ±300 mA
    Ranges 300 mA to 30 nA
    Accuracy (reading% + range% + offset) 0.1% + 0.05% + 30 fA
    Maximum Resolution 1.5 pA
    Compliance Voltage Range (floating) ±8 V
    Auxiliary Electrodes (A, B, C, D)
    Connections 4 (each differential)
    Specifications Same as RE above
    DC Measurements Synchronized to RE
    Impedance Measurement Bandwidth
    * not compatible with Photoelectrochemical card
    1 MHz (via FRA)
    Optics
    Wavelength Range 350 nm - 1100 nm
    Intensity Range 6 decades (with ND filter)
    Max Beam Divergence
    Max Beam Diameter / cell size 1 cm
    IMPS / IMVS Transfer Function Reference Photodetector
    Calibration NIST Traceable
    LED Driver Max Current 10 A
    Typical LED Stability at MAX power < 2% drift after 24hrs
    LED Driver Max Frequency (IMPS and IMVS) 250 kHz
    LED Options
    LED Options (nm) Max Power (mA) Bandwidth (FWHM) (nm)
    420 500 12
    455 1000 18
    470 1600 29
    505 1000 30
    530 1600 31
    590 1600 14
    625 1000 16
    660 1200 25
    Cold White 1000 n/a
    Warm White 1000 n/a
    More Options available upon request
    Frequency Response Analyzer
    Maximum Sample Rate 40 MS/s
    Frequency Range
    (1 MHz and 300 kHz options)
    10 µHz to 1 MHz or 10 µHz to 300 kHz
    Frequency Resolution 1 in 65,000,000
    Frequency Error ±100 ppm
    Minimum Integration Time per measurement
    (single sine, FFT or Harmonic)
    10 ms
    Signal Output
    Waveform Single Sine, Multisine
    Single Sine Sweep Linear / Logarithmic
    Multi-Sine All Frequencies or Selected Frequencies
    Analysis Channels
    Accuracy (ratio) ± 0.1%, ± 0.1°
    Anti-alias and digital filters Automatic
    Analysis Channels RE, WE, Aux A/B/C/D
    Analysis Modes Single Sine, FFT, Harmonic
  • Options +


    The Optical bench is shipped with a 590nm LED as standard. We also offer a range of LED's that can be ordered separately.
    LED Options
    LED Options (nm) Max Power (mA) Bandwidth (FWHM) (nm)
    420 500 12
    455 1000 18
    470 1600 29
    505 1000 30
    530 1600 31
    590 1600 14
    625 1000 16
    660 1200 25
    Cold White 1000 n/a
    Warm White 1000 n/a
    IPCE Options
    General
    Monochromator Wavelength
    350 nm - 1100 nm
    Min. Step Size
    10 nm
    Typical Bulb Lifetime
    100 hrs
    Temperature Drift of Cell with Bias Light
    <1 Deg C after 10 min warm-up
  • Accessories +

  • Video +

    Watch video demonstrations of the ModuLab XM Photoelectrochemical Test System

  • Software +

    • XM-studio Software | Potentiostat | Solartron Analytical

      • Wide range of electrochemical test techniques, including cyclic voltammetry, NPV/DPV, impedance, AC voltammetry and Mott-Schottky
      • Wide range of materials test techniques, including I-V, C-V, impedance and Mott-Schottky
      • Full support of XM products including ModuLab, ModuLab XM and Apps-XM series
      • Full support of Power Boosters up to 100 V and 100 A for DC and EIS electrochemistry
      • Integrated temperature control including custom designed cryostats and furnaces
      • Integrated equivalent circuit and electronic materials fitting functions

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    • ZView Software

      • ZView is the companion EIS data analysis software for ZPlot
      • Multiple display formats (impedance, admittance, capacitance, permittivity and electrical modulus)
      • Comprehensive data analysis capabilities include an extensive library of equivalent circuit data fit models – R, C, L, Warburg, Distributed Elements

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