Materials Lab XM

Materials Lab XM is an application specific XM (Xtreme Measurement) product that is primarily focused on materials research.

The Materials Lab XM product provides a fully integrated reference grade time domain and AC measurement platform. No need to switch sample connections between techniques. Time domain measurements include I-V (current voltage) characterization as well as fast pulse techniques. AC testing techniques include everything from single-sine analysis, to multisine / Fast Fourier Transform for faster low frequency analysis, to harmonics and intermodulation for testing linearity and breakdown of materials. Measurements of electrical impedance spectroscopy (EIS), admittance, permittivity and capacitance are all provided from the XM-studio MTS software platform, together with integrated equivalent circuit analysis functionality.

Time domain and AC tests can be combined in test sequences and instantly switched, allowing DC and pulse waveforms to activate charge carriers, followed immediately by EIS analysis of the activated carriers. This closely linked integration is only with the Materials Lab XM. Measurements include:

  • I-V (voltage scans with current measurement - used to characterize electronic and dielectric materials)
  • P-E (polarization / electric field - used to run hysteresis tests to characterize ferroelectric materials) 
  • High-speed pulse (used to activate charge carriers in electronic and dielectric materials)
  • Staircase and smooth stepless analog ramp waveforms
  • Impedance, admittance, permittivity / capacitance, electrical modulus
  • C-V capacitance - voltage, Mott-Schottky
  • Automatic sequencing of time domain and impedance/capacitance measurements
  • Documentation +

  • Specifications +


    Time Domain Analyzer
    Measurement Mode 2, or 4 terminal
    Connections to sample Gen, VHi, VLo, I
    Sample connection cables 4 x BNC-BNC (1 m)
    Impedance measurement bandwidth 1 MHz (via FRA)
    Floating Yes
    Generator (Gen)
    Smooth scan generator
    64 Ms/s interpolated
    and filtered
    Maximum Voltage (open-circuit load)
    DC + peak AC (subject to slew rate limit)
    ±8 V
    Maximum voltage resolution
    150 μV (<3 V)
    400 μV (≥3 V)
    Maximum output current
    ±100 mA
    Output impedance (nominal)
    50 Ω
    Applied voltage error (open-circuit load)
    ±0.2% setting
    ±800 μV (<3 V)
    / ±2 mV (≥3 V)
    Voltage scan rate 1.6 MV/s to 1 μV/s
    Recommended maximum scan rate
    (using 1 MS/s acquisition rate)
    25 kV/s
    Minimum pulse duration
    1 μs 
    Maximum slew rate  >10 V/μs 
    Voltage Measurement (VHi / VLo)
    Maximum Voltage Measurement ±8 V 
    Ranges  8 V,
    3 V to 3 mV in decades 
    Accuracy (reading % + range % + offset)  0.1% + 0.05% + 100 μV 
    Maximum time domain sample rate  1 MS/s 
    Maximum resolution  1 μV 
    Current Measurement (I)
    Maximum current ±100 mA
    Ranges 100 mA,
    30mA to 30 nA in decades
    Accuracy (reading % + range % + offset) 0.1% + 0.05% + 100 pA
    Maximum time domain sample rate 1 MS/s
    Maximum resolution 1.5 pA
    Auxiliary Voltage Inputs
    Number of auxiliary DC channels
    Four
    Specification Same as VHi/VLo
    Sychronized to VHi/VLo measurement Yes

    Frequency Response Analyzer
    Maximum sample rate
    40 MS/s
    Frequency range
    10 µHz to 1 MHz
    Frequency resolution 1 in 65,000,000
    Frequency error
    ±100 ppm
    Minimum ∫ time per measurement
    (single sine, FFT or harmonic)
    10 ms
    Signal Output
    Waveform
    Single sine, multi-sine 
    Single Sine
    Linear / logarithmic
    Multi-sine / harmonic frequencies
    All or selected
    Analysis channels
    Accuracy (ratio)
    ±0.1%, ±0.1
    Anti-alias, digital filters, DC bias reject
    Automatic
    Analysis modes
    Single sine, FFT, Harmonic
    DC Bias rejection
    Automatic
  • Accessories +

  • Software +

    • XM-studio Software | Potentiostat | Solartron Analytical

      • Wide range of electrochemical test techniques, including cyclic voltammetry, NPV/DPV, impedance, AC voltammetry and Mott-Schottky
      • Wide range of materials test techniques, including I-V, C-V, impedance and Mott-Schottky
      • Full support of XM products including ModuLab, ModuLab XM and Apps-XM series
      • Full support of Power Boosters up to 100 V and 100 A for DC and EIS electrochemistry
      • Integrated temperature control including custom designed cryostats and furnaces
      • Integrated equivalent circuit and electronic materials fitting functions

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    • ZView Software

      • ZView is the companion EIS data analysis software for ZPlot
      • Multiple display formats (impedance, admittance, capacitance, permittivity and electrical modulus)
      • Comprehensive data analysis capabilities include an extensive library of equivalent circuit data fit models – R, C, L, Warburg, Distributed Elements

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