Apps XM Series

Monday, May 8, 2017

SOLARTRON ANALYTICAL BROADENS APPS-XM SERIES WITH ADDITION OF THREE NEW APPLICATION-SPECIFIC PRODUCTS

Oak Ridge, TN-- Solartron Analytical, a unit of AMETEK Advanced Measurement Technology (AMT) has expanded its Apps-XM Series of application-specific XM (Xtreme Measurement) instruments with the addition of the EchemLab XM, SolarLab XM and MaterialsLab XM.

The new Apps-XM Series now includes four versatile, application-focused instruments developed with specific capabilities to assist with closely targeted research. The instruments within the new Apps-XM Series occupy less than half of the footprint of other competitive units, saving valuable lab space while remaining competitively priced. 

  • EnergyLab XM, the first product in the Apps-XM Series launched in March 2016, offers tailored testing solutions for a variety of energy storage devices, including batteries, supercapacitors, and fuel cells.
  • EchemLab XM, which focuses on corrosion/coatings, anodization studies, and physical/analytical electrochemistry, includes a reference grade potentiostat, frequency response analyzer (FRA) and a 100 V high-voltage amplifier.  The unit includes multiple AC techniques including single sine, harmonic analysis, and multisine.
  • SolarLab XM, which focuses on solar cell / photovoltaic (PV) research, is used to test a variety of PV materials including Dye Sensitized Solar Cells (DSSC) and Perovskites Solar Cells. Solartron worked with Professor Laurie Peter of Bath University in the United Kingdom to develop the PhotoEchem module. An Incident Photon to Current Efficiency (IPCE) option also is available for Quantum Efficiency studies.
  • MaterialsLab XM, which targets materials research, provides a fully integrated, reference grade, time domain and AC measurement platform, provides highest accuracy DC and EIS. Low frequency to 10 µHz is available for degradation, trap state, and material purity studies. In addition, the unit offers instant switching between Time Domain (I-V, pulse) and EIS without changing sample connections.